Smentkowski, Vincent S.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

ToF-SIMS depth profiling of organic solar cell layers using an Ar cluster ion source

Smentkowski, Vincent S., Zorn, Gilad, Misner, Amanda, Parthasarathy, Gautam, Couture, Aaron, Tallarek, Elke, Hagenhoff, Birgit

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 1.35 MB

english, 2013

2

Laser Activation Modification of Semiconductor Surfaces (LAMSS)

Zhang, Feng, Pei, Lei, Bennion, Eliot, Jiang, Guilin, Connley, David, Yang, Li, Lee, Michael V., Davis, Robert C., Smentkowski, Vincent S., Strossman, Greg, Linford, Matthew R., Asplund, Matthew C.

Journal:

Year:

2006

Language:

english

File:

PDF, 517 KB

english, 2006

3

Characterization of Surface and Sub- Surface Defects on Devices using Complimentary Techniques

Smentkowski, Vincent S., Ostrowski, Sara G., Denault, Lauraine, Woychik, Charles G.

Journal:

Microscopy Today

Year:

2008

Language:

english

File:

PDF, 2.41 MB

english, 2008

4

Method for fluorination of diamond surfaces

S Smentkowski Vincent

Journal:

Journal of Fluorine Chemistry

Year:

1998

Language:

english

File:

PDF, 95 KB

english, 1998

5

Failure Mechanisms of Fiber Optic Temperature Sensors in High Temperature and Vibration Environments

Tsakalakos, Loucas, Dani, Uttara A., Lee, Boon K., Lee, Susanne M., Mandal, Sudeep, Smentkowski, Vincent, Soni, Sunilkumar

Journal:

Year:

2016

Language:

english

File:

PDF, 1.15 MB

english, 2016

6

Simple statistically based alternatives to MAF for ToF-SIMS spectral image analysis

Michael R. Keenan, Vincent S. Smentkowski

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 2.78 MB

english, 2011

7

Radiofrequency pulsed glow discharge-ToFMS depth profiling of a CdTe solar cell: A comparative study versus time of flight secondary ion mass spectrometry

Gonzalez-Gago, Cristina, Pisonero, Jorge, Bordel, Nerea, Sanz-Medel, Alfredo, Tibbetts, Nicole J., Smentkowski, Vincent S.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 1.81 MB

english, 2013

8

Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications

Choi, Pyuck-Pa, Cojocaru-Mirédin, Oana, Abou-Ras, Daniel, Caballero, Raquel, Raabe, Dierk, Smentkowski, Vincent S., Park, Chan Gyung, Gu, Gil Ho, Mazumder, Baishakhi, Wong, Man Hoi, Hu, Yan-Ling, Melo

Journal:

Microscopy Today

Year:

2012

Language:

english

File:

PDF, 4.57 MB

english, 2012

9

Universal calibration of W5%Re vs W26%Re (type-C) thermocouples in the temperature range 32–2588 K

Smentkowski, Vincent S.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1996

Language:

english

File:

PDF, 367 KB

english, 1996

10

Surface Analysis and Techniques in Biology || Near-Field Scanning Optical Microscopy: A New Tool for Exploring Structure and Function in Biology

Smentkowski, Vincent S.

Year:

2014

Language:

english

File:

PDF, 1.26 MB

english, 2014

11

Surface Analysis and Techniques in Biology || Multi-technique Characterization of DNA-Modified Surfaces for Biosensing and Diagnostic Applications

Smentkowski, Vincent S.

Year:

2014

Language:

english

File:

PDF, 5.29 MB

english, 2014

12

Analysis of Li Ion Battery Anodes Using In-situ FIB-ToF-SIMS

Smentkowski, Vincent, Hart, Richard, Cao, Hongbo, Kollmer, Felix, Zakel, Julia, Arlinghaus, Henrik

Journal:

Microscopy and Microanalysis

Year:

2020

File:

PDF, 471 KB

2020

13

Welcome from the Program Committee

Giovannucci, David, Brewer, Luke, Watanabe, Masashi, Susan, Donald, Ruiz, Teresa, Smentkowski, Vincent, Turnquist, Dustin

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 437 KB

english, 2011

14

Chemomechanical Nanolithography: Nanografting on Silicon and Factors Impacting Linewidth

Lee, Michael V., Hoffman, Melinda Tonks, Barnett, Katherine, Geiss, John-Mark, Smentkowski, Vincent S., Linford, Matthew R., Davis, Robert C.

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2006

Language:

english

File:

PDF, 489 KB

english, 2006

15

Quantitative imaging of trace B in Si and SiO 2 using ToF-SIMS

Smentkowski, Vincent S.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2015

Language:

english

File:

PDF, 940 KB

english, 2015

16

Using ToF-SIMS to study industrial surface phenomena

Smentkowski, Vincent S., Keenan, Michael R., Arlinghaus, Henrik

Journal:

Surface Science

Year:

2016

Language:

english

File:

PDF, 2.17 MB

english, 2016

17

Introduction to a Special Issue on Surface Analysis

Smentkowski, Vincent S.

Journal:

Microscopy Today

Year:

2011

Language:

english

File:

PDF, 1.13 MB

english, 2011

18

Trends in sputtering

Vincent S. Smentkowski

Journal:

Progress in Surface Science

Year:

2000

Language:

english

File:

PDF, 2.50 MB

english, 2000

19

[American Institute of Aeronautics and Astronautics 37th Joint Propulsion Conference and Exhibit - Salt Lake City,UT,U.S.A. (08 July 2001 - 11 July 2001)] 37th Joint Propulsion Conference and Exhibit - Hall thruster plume effects and sputtering of spacecraft surfaces

Hu, Sidney, Joshi, A., Khayms, Vadim, Emgushov, Brian, Werthman, Lance, Smentkowski, Vincent

Year:

2001

Language:

english

File:

PDF, 1.07 MB

english, 2001

20

Surface Analysis and Techniques in Biology || Applications of XPS in Biology and Biointerface Analysis

Smentkowski, Vincent S.

Year:

2014

Language:

english

File:

PDF, 620 KB

english, 2014

21

Mitigating dead-time effects during multivariate analysis of ToF-SIMS spectral images

Michael R. Keenan, Vincent S. Smentkowski, James A. (Tony) Ohlhausen, Paul G. Kotula

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 960 KB

english, 2008

22

Strain induced microstructural and ordering behaviors of epitaxial Fe38.5Pd61.5 films grown by pulsed laser deposition

Steiner, Matthew A., Comes, Ryan B., Floro, Jerrold A., Soffa, William A., Fitz-Gerald, James M., Smentkowski, Vincent S.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 7.49 MB

english, 2013

23

Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool

Smentkowski, Vincent S., Ostrowski, Sara G.

Journal:

Review of Scientific Instruments

Year:

2007

Language:

english

File:

PDF, 820 KB

english, 2007

24

Laser activation-modification of semiconductor surfaces (LAMSS) of 1-alkenes on silicon: A ToF-SIMS, chemometrics, and AFM analysis

Lei Pei, Guilin Jiang, Robert C. Davis, Jeremy M. Shaver, Vincent S. Smentkowski, Matthew C. Asplund, Matthew R. Linford

Journal:

Applied Surface Science

Year:

2007

Language:

english

File:

PDF, 3.80 MB

english, 2007

25

Silicon carbide oxidation in the presence of cesium: Modeling and analysis

Chatterjee, Aveek, Piao, Hong, Matocha, Kevin, Fronheiser, Jody, Tilak, Vinayak, Smentkowski, Vincent

Journal:

Journal of Applied Physics

Year:

2010

Language:

english

File:

PDF, 1.15 MB

english, 2010

26

Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data

Keenan, Michael R., Smentkowski, Vincent S., Ulfig, Robert M., Oltman, Edward, Larson, David J., Kelly, Thomas F.

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 344 KB

english, 2011

27

The statistics of ToF-SIMS data revisited and introduction of the empirical Poisson correction

Keenan, Michael R., Smentkowski, Vincent S.

Journal:

Surface and Interface Analysis

Year:

2016

Language:

english

File:

PDF, 1.24 MB

english, 2016

28

Surface Analysis and Techniques in Biology ||

Smentkowski, Vincent S.

Year:

2014

Language:

english

File:

PDF, 25.30 MB

english, 2014

29

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images—looking beyond the obvious

Vincent S. Smentkowski, J.A. (Tony) Ohlhausen, P.G. Kotula, M.R. Keenan

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 491 KB

english, 2004

30

Effect of Surface Free Energy on PDMS Transfer in Microcontact Printing and Its Application to ToF-SIMS to Probe Surface Energies

Yang, Li, Shirahata, Naoto, Saini, Gaurav, Zhang, Feng, Pei, Lei, Asplund, Matthew C., Kurth, Dirk G., Ariga, Katsuhiko, Sautter, Ken, Nakanishi, Takashi, Smentkowski, Vincent, Linford, Matthew R.

Journal:

Year:

2009

Language:

english

File:

PDF, 3.30 MB

english, 2009

31

Direct Adsorption and Detection of Proteins, Including Ferritin, onto Microlens Array Patterned Bioarrays

Zhang, Feng, Gates, Richard J., Smentkowski, Vincent S., Natarajan, Sriram, Gale, Bruce K., Watt, Richard K., Asplund, Matthew C., Linford, Matthew R.

Journal:

Journal of the American Chemical Society

Year:

2007

Language:

english

File:

PDF, 126 KB

english, 2007

32

In-situ plasma cleaning of samples to remove hydrocarbon and/or polydimethylsiloxane prior to ToF-SIMS analysis

Smentkowski, Vincent S., Moore, C. A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

33

Fluorination of diamond — C4F9I and CF3I photochemistry on diamond (100)

Vincent S. Smentkowski, John T. Yates Jr., Xiaojie Chen, William A. Goddard III

Journal:

Surface Science

Year:

1997

Language:

english

File:

PDF, 1.56 MB

english, 1997

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски